Lorlin® manufactures and sells high performance discrete semiconductor testers offering the highest quality standards available at affordable prices. The discrete test systems are designed to accurately verify and check the critical parameters of small signal and power semiconductor components.  The parametric tests include breakdown voltages, leakage currents, gain, saturation voltages, RDSon, on-state, off-state among many others.  The devices tested can be in a single, multi-device array, or hybrid package. such as TO-3, TO-220, TO-92, SOT-23, TO18, DO4, SOIC, DPAK, and any other standard or custom part type. The  high reliability automatic discrete testers, can be used in all testing applications for Transistors, Darlington's, Diodes, Mosfets, JFETs, Power FETs,  Zeners, Rectifiers, Bridges, IGBTs, SCRs, Triacs, Hybrids and Opto-Coupled Devices, ensuring reliable, accurate, and repeatable results. The Lorlin® testers include the most powerfult testing software in the industry and operate under a Windows 7/8® and up 64-BIT OS with a USB 2.0 tester communications interface for the highest performance, speed and accuracy possible.

 

These 2 videos introduce QMAX and present their capabilities. See https://www.youtube.com/watch?v=io94ACHwCHI for the first video, the second will follow on.

For more information on QMAX Test systems please contact Chris at CoreTest Technologies.

Marvin Test Solutions, Pickering, MacPanel are presenting a seminar at Hilton Garden Inn, North Everet, Seattle on October 13, 2015 / 9:30 AM - 1:30 PM. This seminar will help you to understand how the latest advances in modular  architectures, mass interconnects, and test programming software can  reduce your capital equipment costs, system footprint, and time to test without compromising test system performance.