CoreTest Technologies

CoreTest Technologies offers a wide range of Semiconductor Test Interface products from the leaders in their fields.

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- Global turn-key interface board suply. Design, fabrication through to assembly and test.
- European design centre near Paris
- All Semiconductor ATE Interface Board type supplied
- Design centres in Dallas USA, Chandler USA, Paris France, Singapore, Philippines.

For a full presentation of DTS capabilities and service click the logo to view their website.

- Test sockets, contactors and test fixtures for all package & signal types including optical devices.
- Adaptor Sockets
- Handler Change Kits
- Docking Systems
- Vacuum Pick-Up Cups
- Precision Engineering

For a full presentation of DTS capabilities and service click the logo to view their website.

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Test and Burn-In sockets and contactors using a unique polymer membrane resulting in bandwidths of up to 60GHz.

For a full presentation of Paricon products and click the logo to view the website.

Standard CSP sockets for 1.5x1.5mm to 10x10mm packages are shipping in 4 weeks. Contactors for all handlers are supplied and designed specifically for each application.

Sockets are suitable for all device pitches from 1.27mm to 0.1mm -REGARDLESS OF DEVICE CONTACT FOOTPRINT.

Capable of >1 million insertions with no loss of contact resistance. Actual number of insertions depends on the device contact finish.

These use the same contact material and have the same characteristics as the CSP sockets above. They are used in handlers as the contactor and are robust. They will give a long life with the capability of >1 million insertions.
CS contactors take the package size from 1.5x1.5mm to 30x30mm.

STRIP TEST SOCKET
PariPoser® contactor assemblies are mounted in a metal clamping fixture capable of accommodating a multiplicity of devices in lead frames for test, burn-in and HAST testing.

Part numbers for FXT04: Contact CoreTest Technologies for complete part numbers related to each customer’s application.

This example contacts all 196 devices on the strip, each device has 10 contacts and allows full bandwidth testing

Potential cost savings that are possible by using this socket when compared to the use of conventional Burn-In Sockets include: 10 fold increase in Board utilization. Significant Reductions in Labor and Energy costs are possible. Oven capacity can be increased by as much as10 times.

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A contact restoration service which can extend the life of boards & socket by up to 2 times!
-More than just cleaning - Nu Signal will de-contaminate and re-plate contacts
-The process can be repeated 4-5 times.
- Very cost effective
-Populated PCB's do not have to be stripped
-Burn In sockets restored in situ

For a full presentation of Nu Signal capabilities and service click the logo to view their website.

Damage caused by rolling contacts has increased the contact resistance and results in yeild loss. Previously the only action was to remake the board with resultant down time, costly machine time to debug and calibrate the new board. Now this can be repaired - see the image below.

The board has been decontaminated of oxides, solder and plastic residue. The plating has been replace with new hard gold.
This board has had its life doubled and the process can be repeated up to 5 times!

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Protronix build custom ATE and process equipment. Design competancies include:
- Mechaincal Design
- Electrical Design
- PCB Design
- Software Design
Protronix have built large scale test facilities for Motorola mobile phones, MED display-on-flex production line.

This is a fully automated production conditioning and test line. OLED displays are loaded into pallets and conveyed into a monitored burn in oven where they are monitored spectrally and electrically before being conveyed to the test cell. In the test cell each unit is tested for image quality, missing pixels, visual spectrum. The complete line can be monitored remotely and has web cams installed to aid fault finding.
Finally DUT's are sorted into pass and fail trays by a robotic sorter.

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Qmax, with its innovative methodologies in test engineering, primarily applied in in-circuit test of electronic components in populated PCBs, Qmax has clearly steered miles ahead in the field, setting standards. Proving total test solutions based on the needs of the industry trends at the right time has made Qmax one of the world's leading PCB test companies. Having carved a niche position in the industry, Qmax is actively involved in its pursuit of designing and developing test equipment for semi-con industry and board functional testers.

Qmax’s latest innovative product, the “No Foot- print” QT2216 Full Functional mixed signal tester is designed to help the semiconductor companies doing final test be more competitive in the following ways:

1. Cost effectiveness in terms of capital and maintanance.

2. No Foot Print means less space needed on test floors

3. Functional Flexibility

The advantage of the QT2216 is its adaptability. It can be loaded with different modules to alter its configuration to suit different devices and varied test conditions. It can be configured to test ADC including Sigma Delta type, DAC, High speed digital, Opto, linear, high voltage / current devices etc. Qmax testers can also be integrated to Trim Form handler for In Assembly Test.

The QT16 Opens & Shorts test system has the same form factor and zero footprint as the bigger QT2216. It can test for opens and shorts on a devices after any mechanical process, such as trim & form, solderball attachment or rework, to verify that the input contacts and wire bonds are itact. It tests the input diodes for continuity and functionality. Qmax testers can also be integrated to Trim Form handler for In Assembly Test.

V2000 The VT2200 is a mid range ATE and can be used to test Interface Boards for Semiconductor testers.

Analog Highway Option:
Each Analog highway card handles 16 X 18 relay matrix.
8 test channels from Board Under Test to 8 wire Instrument Terminal at Front Panel of the ATE system.
These 12 wires can be either 12 single wire or Six 2 wire measurement or Three 4 wire measurement
System can be configured up to 2 such cards or 32 X 12 relay matrix.
Signal frequency is from DC to 30MHz.
Voltage within +/-100V DC and current carrying capacity up to 0.5 amps.

External Instrumentation:
Optional External Instruments such as PXI / GPIB can be installed in the system for measurements. PXI based 8 Slot can be fitted with user selected Instruments. PXI rack comes with MXI 4 interface card and copper cable. System can also be configured with GPIB interface to handle many GPIB Instruments stacked in the right side rack.

V200 is a cost effective mini ATE system, designed to cater the needs of PCB Test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FBGA VLSI chips.
It is a Combinational - Mixed Signal Test System with the addition of Boundary Scan Test for Latest generation of Chips. It has Card Edge Functional Test for both digital and analog, In-Circuit Functional Test for Localized test of Individual devices including LSI / VLSI / Memory and Microprocessors. It also incorporates an Advanced QSM VI with user definable wave pattern.

Features
V200 is designed as a Combinational Tester with Digital / Analog and Mixed Signal Test capabilities through simple Clips and probes or through card edge or as a cluster tester with a special test fixture for up to 96 test pins. In addition it has the Boundary Scan Test option for virtual test where the number of virtual test pin has no physical limit. Its basic timing unit is 100ns and thus can generate test patterns at 10 MHz data rate. The timing units are programmable in 2000 steps from 100ns to 200µs,(100ns, 200ns, 300ns etc up to 200µs) thus allowing accurate pattern timings. It has 8K X 4 RAM behind each digital pin electronics and 8K X 24 RAM behind every analog channel. Its advanced sequencer allows external event synchronization or handshake, which are very essential in complex microprocessor tests.

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