CoreTest Technologies

Qmax with its innovative methodologies in test engineering, primarily applied in in-circuit test of electronic components in populated PCBs, Qmax has clearly steered miles ahead in the field, setting standards. Proving total test solutions based on the needs of the industry trends at the right time has made Qmax one of the world's leading PCB test companies. Having carved a niche position in the industry, Qmax is actively involved in its pursuit of designing and developing test equipment for semi-con industry and board functional testers.

The Panther 2k is designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical.
- High speed testing at 2 seconds for 2 million test combinations.
- Can be interfaced to any type of test fixtures
- Multi-Site Test support for Strip or Multiple device test.
- 16 Opto Isolated digital outputs for handler interface, binning and PASS FAIL indicators.
- 16 Opto Isolated Digital Inputs for Operator console and handler interface.
- Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers.
- Fast turnaround time to test new products.

ATE QT2256-320PXI system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform.

It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.

It is an In-Circuit Device / cluster tester when High Current Pin Driver options are installed and interfaced to the UUT either through clips / probes or nail bed. Standard configuration is 64 Channels high current Pin Drivers.

It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.

Functional test for both BS and non BS devices using the Qmax’s exclusive waveform editor including analog for visual test pattern generation and comparison. System support more than one JTAG chain to accommodate BS chains with different voltage levels such as 2.5v, 3.3v or 5v

Signature Analysis (Optional)
In Qmax ATE – QT2256-320PXI, every channel is capable of acquiring logic sates of each digital pin at specified timing strobes. The resultant bit stream is compressed into a 32bit Signature word and thereby building a unique signature for each test channel. Qmax has U.S and U.K Patent rights for their advanced Bus Cycle Signature System to test CPU based boards running on its own clock speed. Each type of CPU will require an external POD to adapt to the test system.

In-Circuit Emulator Option for DSP devices:
There are many popular DSP devices, without Boundary Scan option UUT with In-Circuit Emulator port. The Emulator port is similar to the serial interface. Using the Emulator, one can toggle the Device pins and can carryout functional test of RAM / ROM and other logic devices around the DSP. This may include even ADC / DAC test. Analog voltage forcing and sensing can be done using the Analog channels of the Qmax ATE system.

- IEEE 1149.1 compliant JTAG port
- Boundary Scan Controlled Synchronous
Digital I/O channels
- End-to-end Functional test
- Individually configurable bi-directional I/O channels
- Programmable voltage levels for Digital I/O
- Specific set of channels can be bypassed to minimize scan time.
- Optional : Boundary Scan Controlled
Synchronous Analog I/O

New generation densely populated, multi-layered boards (PCBs) mounted with boundary scan compliance devices, along with non-boundary scan digital and mixed signal devices toss a real challenge when comes for testing and or trouble-shooting.

QScan offers a unique solution in testing these kinds of boards with its easy to use software and libraries. It can perform various tests including interconnect test between JTAG devices and edge connector, functional tests for non boundary scan devices using Boundary Scan Devices’ I/O pins (Virtual test points) and digital I/O channels. Use of virtual test pins and edge connector eliminates the need for expensive test fixture strategy using bed of nails or using a limited channel-flying probe.

QT8200 is an extremely powerful, PC-based fault finding system, capable of locating faults on a wide range of electronic PCBs and equipment. It is the fastest In-Circuit tester available for service & repair department, production test and for third party maintenance.
Qmax uses a host of innovative techniques including the True Power - On Analog In-Circuit Functional test, ESD test,Super VI, Power-Off Circuit Tracing test and the Powerful Clock Terminator test avoids False Alarm and ensures hightest possible fault coverage on a wide range of boards.
RCV measurement
Frequency measurement upto 130 MHz
3 channel Digital Oscilloscope.

The QT8200M is a ruggedizd version of the QT8200 above. It is designed for field use in military, marine, engineering applications where a test set must be brought to the UUT.

For further information or quotation contact Chris Rogalski at info@coretest.co.uk or visit our contact page.